Physics Lab
Home/Class XII/Chapter 14

Chapter 14: Semiconductor Electronics — Materials, Devices and Simple Circuits

In the second half of the twentieth century, electronics moved from vacuum tubes — bulky, hot, fragile — to silicon, the second most abundant element in Earth's crust. A solid that conducts neither well nor poorly, but whose conductivity can be tuned by impurity doping over fifteen orders of magnitude, turned out to be the perfect material for switches, amplifiers, and ultimately every computer. This chapter develops the band picture, distinguishes intrinsic from extrinsic semiconductors, builds the p-n junction (the keystone of all semiconductor devices), and then assembles diodes, rectifiers, Zeners, LEDs, photodiodes, solar cells, transistors, and logic gates from this single building block.

Concept Map

Energy bands
  Conductors (overlap) / Insulators (Eg≫kT) / Semiconductors (Eg~1 eV)
        │
        ├── Intrinsic (pure Si/Ge)  n = p = n_i, thermally generated
        │
        └── Extrinsic
              n-type (donor P, As, Sb) — electrons majority
              p-type (acceptor B, In, Al) — holes majority
                        │
                        └── p-n junction (depletion region, V_b ~ 0.7 V)
                                   │
                                   ├── Diode (forward / reverse / breakdown)
                                   │       ├── Half-wave rectifier
                                   │       ├── Full-wave (centre-tap, bridge)
                                   │       └── Zener regulator
                                   │       └── LED, Photodiode, Solar cell
                                   │
                                   └── Bipolar Junction Transistor (npn / pnp)
                                              CE amplifier, switch
                                                       │
                                                       └── Logic gates
                                                              (NOT, AND, OR, NAND, NOR, XOR)

14.1 Energy Bands and Classification

Definition

When isolated atoms come together to form a solid, the discrete atomic energy levels of each atom split and overlap, forming continuous energy bands. Two bands matter for electrical behaviour:

  • Valence band (VB): highest band that is completely (or partially) full at T=0T = 0.
  • Conduction band (CB): next higher band, normally (mostly) empty at T=0T = 0.

They are separated by a forbidden energy gap EgE_g in which no electronic states exist.

MaterialBand structure at 0 K0\ \text{K}EgE_g (eV)Examples
ConductorVB & CB overlap (or CB partly filled)00Cu, Ag, Al, Au
InsulatorVB full, CB empty, large gap>3> 3Diamond (5.55.5), SiO2_2 (99)
SemiconductorVB full, CB empty, small gap1\sim 1Si (1.121.12), Ge (0.720.72), GaAs (1.431.43)

At room temperature (kT0.026 eVkT\approx 0.026\ \text{eV}), thermal excitation across Eg1 eVE_g\sim 1\ \text{eV} in Si is rare but non-zero, giving semiconductors their intermediate (and temperature-sensitive) conductivity.

Derivation — carrier concentration vs temperature

The probability of an electron being in a CB state of energy EE is given (in the non-degenerate Maxwell–Boltzmann limit) by f(E)e(EEF)/kTf(E)\approx e^{-(E - E_F)/kT}. The number of electrons in CB is approximately

nNCe(ECEF)/kT,n \approx N_C\,e^{-(E_C - E_F)/kT},

with NCN_C the effective density of states. For intrinsic material, EFE_F sits roughly midway in the gap and

niT3/2eEg/2kT.n_i \propto T^{3/2}\,e^{-E_g/2kT}.

The exponential factor explains the dramatic conductivity rise with TT in semiconductors — opposite to metals, where resistivity rises with TT (lattice scattering).

Worked Example

At T=300 KT = 300\ \text{K}, intrinsic Si has ni=1.5×1010 cm3n_i = 1.5\times 10^{10}\ \text{cm}^{-3}. At T=600 KT = 600\ \text{K}, estimate nin_i.

Assume niT3/2eEg/2kTn_i\propto T^{3/2}\,e^{-E_g/2kT}. The exponential dominates:

ni(600)ni(300)(600300)3/2 ⁣exp ⁣[1.1228.617×105 ⁣(16001300)].\frac{n_i(600)}{n_i(300)}\approx \left(\frac{600}{300}\right)^{3/2}\!\exp\!\left[-\frac{1.12}{2\cdot 8.617\times 10^{-5}}\!\left(\frac{1}{600} - \frac{1}{300}\right)\right].

The exponential argument: 1.1228.617×1051600=+10.83-\dfrac{1.12}{2\cdot 8.617\times 10^{-5}}\cdot \dfrac{-1}{600} = +10.83. So nin_i grows by factor 2.83e10.831.5×105\sim 2.83\cdot e^{10.83}\approx 1.5\times 10^5, giving ni(600 K)2×1015 cm3n_i(600\ \text{K})\approx 2\times 10^{15}\ \text{cm}^{-3}.

Pitfalls

  • A conductor has Eg=0E_g = 0 (or partially filled CB), not negative.
  • For insulators vs. semiconductors, the only sharp difference is EgE_g; there is no fundamental physical line, just the operating temperature range.
  • Semiconductor resistivity decreases with TT, opposite to metals.

14.2 Intrinsic Semiconductors

Definition

An intrinsic (pure) semiconductor contains only the host atoms (Si or Ge) — no foreign impurities. At any T>0T > 0, thermal energy excites some electrons from VB to CB, leaving behind holes (vacant states in VB that behave as positive carriers).

Charge-neutrality: n=p=ni(T)n = p = n_i(T), the intrinsic carrier concentration.

For silicon at 300 K300\ \text{K}: ni=1.5×1010 cm3n_i = 1.5\times 10^{10}\ \text{cm}^{-3} (compared with 5×1022 cm3\sim 5\times 10^{22}\ \text{cm}^{-3} Si atoms — only 11 in 101310^{13} Si atoms is ionized).

Conductivity

Conductivity has contributions from both electrons and holes:

σ=e(nμn+pμp),\sigma = e(n\mu_n + p\mu_p),

where μn\mu_n, μp\mu_p are the electron and hole mobilities (m2^2/V·s). For Si at 300 K: μn1350 cm2\mu_n \approx 1350\ \text{cm}^2/V·s, μp480 cm2\mu_p \approx 480\ \text{cm}^2/V·s.

Worked Example

Compute the intrinsic conductivity of Si at 300 K.

σ=(1.6×1019)1.5×1016 m3(0.135+0.048)\sigma = (1.6\times 10^{-19})\cdot 1.5\times 10^{16}\ \text{m}^{-3}\cdot (0.135 + 0.048)

Wait — convert nin_i to m3^{-3}: 1.5×1010 cm3=1.5×1016 m31.5\times 10^{10}\ \text{cm}^{-3} = 1.5\times 10^{16}\ \text{m}^{-3}, and mobilities to m2^2/V·s: μn=0.135\mu_n = 0.135, μp=0.048\mu_p = 0.048.

σ=(1.6×1019)1.5×1016(0.135+0.048)=4.4×104 S/m.\sigma = (1.6\times 10^{-19})\cdot 1.5\times 10^{16}\cdot (0.135 + 0.048) = 4.4\times 10^{-4}\ \text{S/m}.

Resistivity ρ=1/σ2.3×103 Ωm\rho = 1/\sigma \approx 2.3\times 10^3\ \Omega\cdot\text{m}. (Intrinsic Si is a poor conductor — but very different from an insulator.)

Pitfalls

  • The intrinsic carrier density depends exponentially on TT — even a 10 K change matters.
  • Holes are not anti-particles of electrons; they are missing electrons in the VB, but conveniently treated as positive mobile carriers.
  • For Ge (Eg=0.72 eVE_g = 0.72\ \text{eV}), nin_i at 300 K is 2.4×1013 cm3\sim 2.4\times 10^{13}\ \text{cm}^{-3} — 1500×\times larger than Si, because of the smaller gap.

14.3 Extrinsic Semiconductors — n-type and p-type

Definition

By deliberately adding tiny amounts (11 ppm or less) of pentavalent or trivalent impurities to tetravalent Si/Ge, the carrier concentrations can be controlled by factors of 10510^5101010^{10}. This is doping.

n-type (donor doping)

Add a pentavalent impurity (group V): phosphorus, arsenic, antimony. Four of its valence electrons make covalent bonds with neighbouring Si; the fifth is loosely bound — at room temperature this fifth electron is freed into the CB with only 0.045 eV\sim 0.045\ \text{eV} activation (Phosphorus in Si). The donor atom becomes a fixed positive ion.

  • Majority carriers: electrons (concentration nNDn\approx N_D, the donor density).
  • Minority carriers: holes (very few).
  • Mass-action law: np=ni2np = n_i^2.

Energy diagram: a donor level EDE_D appears just 0.045 eV\sim 0.045\ \text{eV} below the conduction band edge ECE_C.

p-type (acceptor doping)

Add a trivalent impurity (group III): boron, aluminium, indium, gallium. It has only three valence electrons, so when bonded with four Si neighbours one bond is incomplete — a hole sits at the impurity. At room temperature this hole easily detaches into the VB; the acceptor atom becomes a fixed negative ion.

  • Majority carriers: holes (pNAp\approx N_A, the acceptor density).
  • Minority carriers: electrons.
  • Mass-action law: np=ni2np = n_i^2.

Energy diagram: an acceptor level EAE_A appears just above the valence band edge EVE_V.

Mass-action Law

Even after doping, the product npnp remains constant at thermal equilibrium:

  np=ni2(T).  \boxed{\;np = n_i^2(T).\;}

So in heavily-doped n-type with n=ND=1016 cm3n = N_D = 10^{16}\ \text{cm}^{-3} and ni=1.5×1010 cm3n_i = 1.5\times 10^{10}\ \text{cm}^{-3}, the minority hole concentration is p=ni2/n=2.25×104 cm3p = n_i^2/n = 2.25\times 10^{4}\ \text{cm}^{-3} — twelve orders of magnitude less than electrons.

Worked Example

A Si sample is doped with 5×1016 cm35\times 10^{16}\ \text{cm}^{-3} of P. Find majority and minority carrier densities at 300 K. (ni=1.5×1010 cm3n_i = 1.5\times 10^{10}\ \text{cm}^{-3}.)

Majority (electrons): nND=5×1016 cm3n \approx N_D = 5\times 10^{16}\ \text{cm}^{-3}.

Minority (holes): p=ni2/n=(1.5×1010)2/(5×1016)=4.5×103 cm3p = n_i^2/n = (1.5\times 10^{10})^2/(5\times 10^{16}) = 4.5\times 10^{3}\ \text{cm}^{-3}.

Pitfalls

  • The doped semiconductor remains electrically neutral — the donor (or acceptor) ions cancel the mobile carriers' charge.
  • "n-type" does not mean negatively charged — only that electrons are the majority carriers.
  • "Doping" with 1 ppm\sim 1\ \text{ppm} is enough to change conductivity by 10510^5101010^{10}; precise control is what makes semiconductor industry possible.

14.4 p-n Junction — Formation, Depletion Region, Barrier

Definition

When a single crystal of Si is doped p-type on one side and n-type on the other (by diffusion or implantation), a p-n junction forms at the metallurgical interface.

Three things happen immediately upon junction formation:

  1. Diffusion: electrons from n-side (high concentration) diffuse into p-side; holes from p-side diffuse into n-side. They recombine near the junction.
  2. Depletion region: a thin layer (width W0.1W\sim 0.11 μm1\ \mu\text{m}) on either side of the junction becomes depleted of mobile carriers, leaving behind the fixed donor (+) and acceptor (-) ions.
  3. Built-in potential / barrier: the fixed ions set up an electric field E\vec E pointing from n to p, opposing further diffusion. At equilibrium, drift (driven by E\vec E) balances diffusion, and a built-in potential VbV_b (also called barrier potential) is established:
Vb=kTeln ⁣(NANDni2).V_b = \frac{kT}{e}\ln\!\left(\frac{N_A N_D}{n_i^2}\right).

Typical: Vb0.3 VV_b \approx 0.3\ \text{V} (Ge), 0.7 V\approx 0.7\ \text{V} (Si). Note no current flows in the open-circuit equilibrium.

Drift vs. Diffusion Currents at Equilibrium

In the depletion region, the field E\vec E drives a drift current JdriftJ_{\text{drift}} of minority carriers (electrons in p, holes in n, both pushed across the junction). The diffusion current JdiffJ_{\text{diff}} of majority carriers (electrons from n to p, holes from p to n) flows in opposite direction. At equilibrium they cancel exactly:

Jdrift+Jdiff=0.J_{\text{drift}} + J_{\text{diff}} = 0.

Worked Example

For a Si p-n junction with NA=ND=1016 cm3N_A = N_D = 10^{16}\ \text{cm}^{-3} at 300 K, compute VbV_b.

Vb=0.0259ln ⁣(10161016(1.5×1010)2)=0.0259ln(4.44×1011)=0.025926.82=0.695 V.V_b = 0.0259\,\ln\!\left(\frac{10^{16}\cdot 10^{16}}{(1.5\times 10^{10})^2}\right) = 0.0259\cdot\ln(4.44\times 10^{11}) = 0.0259\cdot 26.82 = 0.695\ \text{V}.

(Right at the "0.7 V" rule of thumb.)

Pitfalls

  • The depletion region has no mobile carriers but does have fixed ionized donors/acceptors — it is not "empty."
  • VbV_b exists at zero external bias — you cannot measure it directly with a voltmeter (the metal-semiconductor contacts have their own built-in potentials, which cancel out).
  • The electric field in the depletion region can be enormous (105\sim 10^5 V/cm) despite tiny voltages — the region is just very thin.

14.5 Semiconductor Diode — I-V Characteristic

Definition

A p-n junction with external leads is a diode. Its terminals are conventionally the anode (p-side) and cathode (n-side).

Forward Bias (V>0V > 0, p positive)

External voltage reduces the barrier from VbV_b to VbVV_b - V. The depletion width shrinks; majority carriers diffuse across. Current grows exponentially (Shockley equation):

  I=I0 ⁣(eeV/ηkT1),  \boxed{\;I = I_0\!\left(e^{eV/\eta kT} - 1\right),\;}

with I0I_0 the reverse saturation current and η\eta (1–2) the ideality factor. For VkT/e26 mVV\gg kT/e\approx 26\ \text{mV}, current rises quasi-vertically once VV exceeds the cut-in (knee) voltage Vγ0.3 VV_\gamma\approx 0.3\ \text{V} (Ge), 0.7 V\approx 0.7\ \text{V} (Si).

Reverse Bias (V<0V < 0, p negative)

External voltage adds to the barrier. Depletion region widens; majority diffusion is suppressed. Only minority drift remains, giving a tiny reverse saturation current I0 nAI_0\sim\ \text{nA} (Si) to μA\mu\text{A} (Ge) — almost independent of VV.

Breakdown

At a high reverse voltage VZV_Z (the Zener voltage or breakdown voltage), the junction breaks down by one of two mechanisms:

  • Zener breakdown (heavily doped, narrow depletion, VZ5 VV_Z\lesssim 5\ \text{V}): the field tears electrons directly from covalent bonds (tunneling).
  • Avalanche breakdown (lightly doped, VZ6 VV_Z\gtrsim 6\ \text{V}): a minority carrier gains enough KE between collisions to ionize the lattice; carriers multiply geometrically.

The current rises steeply at V=VZV = -V_Z but the voltage clamps to VZ-V_Z — exploited in voltage regulators.

I-V Characteristic (sketch)

        I
        ▲
        │              ⎢ steep
        │              ⎢
        │            ╱
        │          ╱
   ─────┼──────────┼────────────► V
        │ 0.7 V    ↑
   Vz ◄─┘          cut-in
        │
        ▼
     reverse breakdown

Worked Example — Dynamic Resistance

A Si diode has I=10 mAI = 10\ \text{mA} at V=0.70 VV = 0.70\ \text{V} and I=20 mAI = 20\ \text{mA} at V=0.72 VV = 0.72\ \text{V}. Compute the AC (dynamic) resistance.

rd=ΔVΔI=0.02 V0.01 A=2 Ω.r_d = \frac{\Delta V}{\Delta I} = \frac{0.02\ \text{V}}{0.01\ \text{A}} = 2\ \Omega.

Pitfalls

  • The Shockley equation gives a non-linear I-V — most JEE problems use the simplified "ideal diode" approximation: V=VγV = V_\gamma in forward, I=0I = 0 in reverse.
  • Dynamic resistance rd=dV/dIr_d = dV/dI is not the same as static V/IV/I.
  • Reverse saturation current doubles roughly every 10 K10\ \text{K} rise — important for thermal stability.

14.6 Diode as a Rectifier

Definition

A rectifier converts AC to DC by allowing current in only one direction. The diode is the simplest rectifier.

Half-Wave Rectifier (HWR)

Circuit: a single diode in series with the load RLR_L, fed from the secondary of a step-down transformer.

  • During the positive half-cycle, the diode is forward-biased, conducts, and the output across RLR_L follows the input (minus Vγ0.7 VV_\gamma\sim 0.7\ \text{V}).
  • During the negative half-cycle, the diode is reverse-biased, blocks current; output is zero.

Output waveform: a series of positive half-sine "humps," DC + ripple.

ParameterHWRFWR
VDCV_{\text{DC}}Vm/πV_m/\pi2Vm/π2 V_m/\pi
VrmsV_{\text{rms}}Vm/2V_m/2Vm/2V_m/\sqrt 2
Ripple factor r=(Vrms/VDC)21r = \sqrt{(V_{\text{rms}}/V_{\text{DC}})^2 - 1}1.211.210.4820.482
Efficiency40.6%\sim 40.6\%81.2%\sim 81.2\%
Fundamental ripple freq.finf_{\text{in}}2fin2 f_{\text{in}}

Full-Wave Rectifier (FWR) — Centre-Tap

Uses two diodes and a centre-tap transformer. The centre-tap is the common ground; the two ends of the secondary are 180° out of phase.

  • Positive half: D1D_1 conducts, D2D_2 blocks.
  • Negative half: D2D_2 conducts, D1D_1 blocks.

Both halves produce positive output across RLR_L — every half-cycle is used.

Full-Wave Rectifier — Bridge

Uses four diodes in a bridge arrangement; no centre-tap required.

  • Positive half: D1,D3D_1, D_3 conduct; D2,D4D_2, D_4 blocked.
  • Negative half: D2,D4D_2, D_4 conduct; D1,D3D_1, D_3 blocked.

Output is again a stream of positive half-sines but every half-cycle is captured. The bridge rectifier is dominant in modern power supplies (no expensive centre-tap transformer; only one diode drop per half-cycle drawback is compensated).

Filter Capacitor

A capacitor CC in parallel with RLR_L smooths the pulsating DC. During the conducting interval CC charges to nearly VmV_m; when the diodes block, CC discharges into RLR_L with time constant RLCR_L C. Choosing RLCTR_L C \gg T (period of the input) gives nearly pure DC with small ripple voltage

ΔVVm2fRLC(full-wave).\Delta V \approx \frac{V_m}{2 f R_L C}\qquad (\text{full-wave}).

Worked Example

A FWR feeds Vm=12 VV_m = 12\ \text{V} peak into RL=1 kΩR_L = 1\ \text{k}\Omega with a 470 μF470\ \mu\text{F} filter capacitor at 50 Hz50\ \text{Hz} mains. Find the ripple voltage.

ΔV1221001034.7×104=1294=0.128 V.\Delta V \approx \frac{12}{2\cdot 100\cdot 10^3\cdot 4.7\times 10^{-4}} = \frac{12}{94} = 0.128\ \text{V}.

Ripple factor ΔV/(Vm3)6×103\approx \Delta V/(V_m\sqrt 3)\approx 6\times 10^{-3} — quite smooth.

Pitfalls

  • HWR's ripple frequency is ff; FWR's is 2f2f.
  • Centre-tap FWR uses 2 diodes; bridge uses 4. Bridge has 2 diode drops per half-cycle, centre-tap has 1.
  • "Efficiency" here means ratio of DC power to AC input power; the maximum theoretical is 100% (not achieved).

14.7 Special Diodes

Zener Diode

A heavily-doped p-n junction designed to operate in reverse breakdown at a sharp, well-defined voltage VZV_Z. In the breakdown region, current changes by orders of magnitude with negligible voltage change — so the Zener clamps voltage to VZV_Z.

Voltage Regulator Circuit:

Vin ─[R_s]─┬─── V_out (= V_Z)
           │
        [Zener]
           │
          GND

The series resistor RsR_s drops the excess voltage. Provided Vin>VZV_{in}>V_Z and the load current does not exceed IZ,maxI_{Z,\max}, the output stays at VZV_Z even as VinV_{in} varies. Common values: VZ=3.3,5.1,6.2,9.1,12,15,24V_Z = 3.3, 5.1, 6.2, 9.1, 12, 15, 24 V.

Photodiode

A p-n junction in reverse bias, exposed through a transparent window. Incident photons with hν>Egh\nu > E_g create electron-hole pairs in the depletion region, which are swept apart by the built-in field — adding to the reverse current. Reverse current rises linearly with light intensity (over wide range).

Used in optical sensors, light meters, fibre-optic receivers, fast-camera image sensors.

LED (Light-Emitting Diode)

A forward-biased p-n junction made from a direct-bandgap semiconductor (GaAs, GaP, GaN, …). Recombination of injected electrons and holes releases the energy EgE_g as a photon of frequency ν=Eg/h\nu = E_g/h:

MaterialEgE_g (eV)λ\lambda (nm)Colour
GaAs1.43870IR
GaAsP1.9650Red
GaP2.25555Green
GaN3.4365UV/Blue

White LEDs combine a blue GaN chip with a yellow phosphor.

Solar Cell

An unbiased (open-circuit), large-area p-n junction. Sunlight photons with hν>Egh\nu > E_g create electron-hole pairs throughout the depletion region (and within a diffusion length on either side). The junction's built-in field separates them — electrons drift to n-side, holes to p-side — generating a photovoltage. Connected to a load, it drives current.

Operating quadrant: fourth quadrant of I-V (positive VV, negative II in diode convention) — the device delivers power.

Open-circuit voltage VOC0.5V_{OC}\sim 0.50.7 V0.7\ \text{V} (Si); short-circuit current density JSC30 mA/cm2J_{SC}\sim 30\ \text{mA/cm}^2 (under AM1.5 sunlight); efficiency 20%\sim 20\% (commercial Si cells, ~26% lab record).

Pitfalls

  • Zener: operates in reverse breakdown. LED: forward bias. Photodiode/solar cell: reverse / open.
  • LED needs direct-gap material — Si (indirect gap) makes a poor LED.
  • The photon energy in solar cells must exceed EgE_g — energy above EgE_g is wasted as heat (Shockley–Queisser limit 33%\sim 33\% for single-junction).

14.8 Bipolar Junction Transistor (BJT) — Brief

Definition

A BJT is a three-terminal sandwich of doped layers — npn or pnp — with regions called Emitter (E), Base (B), Collector (C). The base is thin and lightly doped; emitter is heavily doped; collector is moderately doped, larger area.

   npn:  n+ │ p │ n
          E   B   C

Operation (npn, common-emitter)

  • E-B junction is forward-biased (VBE0.7 VV_{BE}\approx 0.7\ \text{V}). Electrons flood from emitter into base.
  • B-C junction is reverse-biased (VCB0V_{CB}\gg 0). The (thin) base allows most electrons to diffuse through and be swept into the collector by the strong field. Only a small fraction recombine in the base, giving the base current.

Currents satisfy: IE=IB+ICI_E = I_B + I_C, with ICIBI_C \gg I_B. Define:

  • α=IC/IE<1\alpha = I_C/I_E < 1 (common-base current gain, typically 0.98–0.998).
  • β=IC/IB=α/(1α)1\beta = I_C/I_B = \alpha/(1-\alpha) \gg 1 (common-emitter current gain, typically 50–500).

A small base-current change produces a large collector-current change — this is current amplification.

Transistor as an Amplifier (CE configuration)

In a common-emitter amplifier: input AC voltage vinv_{in} is applied between base and emitter (causing small iBi_B); output is taken across a collector resistor RCR_C.

Voltage gain:

AV=voutvin=βRCrin,A_V = \frac{v_{out}}{v_{in}} = -\beta\,\frac{R_C}{r_{in}},

where rinhier_{in}\approx h_{ie} is the input resistance (1\sim 1 kΩ\Omega typical), and the minus sign indicates a 180°180° phase inversion. Typical AV100A_V \sim 100.

Transistor as a Switch

In a CE circuit:

  • Cut-off region: VBE<VγV_{BE} < V_\gamma, IB=0I_B = 0, IC0I_C\approx 0, VCEVCCV_{CE}\approx V_{CC} → output HIGH, transistor OFF.
  • Saturation region: IBI_B large enough that IC=βIBI_C = \beta I_B would exceed VCC/RCV_{CC}/R_C; the transistor saturates, VCE0.2 VV_{CE}\approx 0.2\ \text{V} → output LOW, transistor ON.

Cut-off and saturation correspond to logic 1 and 0 respectively — the basis of all digital electronics.

Worked Example

For a CE amplifier with β=100\beta = 100, IB=20 μAI_B = 20\ \mu\text{A}. Find ICI_C, IEI_E.

IC=βIB=10020=2000 μA=2 mAI_C = \beta I_B = 100\cdot 20 = 2000\ \mu\text{A} = 2\ \text{mA}. IE=IB+IC=2.02 mAI_E = I_B + I_C = 2.02\ \text{mA}.

Pitfalls

  • βα\beta\ne\alpha, but β=α/(1α)\beta = \alpha/(1-\alpha).
  • IE=IB+ICI_E = I_B + I_C — the base current is small, not zero.
  • pnp transistor: all polarities and current directions reverse, but β\beta formula is identical.

14.9 Logic Gates — Symbols and Truth Tables

Definition

A logic gate implements a Boolean function of its binary inputs (00 = low voltage, 11 = high voltage).

NOT Gate (Inverter)

Inverts the input. Symbol: triangle with circle.

AAAˉ\bar A
01
10

Boolean: Y=AˉY = \bar A.

AND Gate

Output 1 only when all inputs are 1.

AABBABA\cdot B
000
010
100
111

Boolean: Y=ABY = A\cdot B.

OR Gate

Output 1 when at least one input is 1.

AABBA+BA+B
000
011
101
111

Boolean: Y=A+BY = A + B.

NAND Gate

NOT-AND: complement of AND. Universal gate (any other gate can be built from NANDs).

AABBAB\overline{A\cdot B}
001
011
101
110

Boolean: Y=ABY = \overline{A\cdot B}.

NOR Gate

NOT-OR. Also universal.

AABBA+B\overline{A+B}
001
010
100
110

Boolean: Y=A+BY = \overline{A + B}.

XOR Gate

Exclusive-OR: output 1 when inputs differ.

AABBABA\oplus B
000
011
101
110

Boolean: Y=ABˉ+AˉBY = A\bar B + \bar A B.

Universal Gates

Both NAND and NOR are universal: any logic function can be built using just NAND or just NOR.

Examples (NAND-only):

  • NOT: connect both inputs together: AA=Aˉ\overline{A\cdot A} = \bar A.
  • AND: NAND followed by NAND: ABAB=AB\overline{\overline{A\cdot B}\cdot \overline{A\cdot B}} = A\cdot B.
  • OR: AˉBˉ=A+B\overline{\bar A \cdot \bar B} = A + B (De Morgan).

Pitfalls

  • NAND \ne AND with negative supply. Read symbols carefully — the bubble denotes inversion.
  • Truth tables for 2-input gates have 22=42^2 = 4 rows; for 3-input, 23=82^3 = 8 rows.
  • XOR is not the same as OR — XOR(1,1) = 0, OR(1,1) = 1.

Solved Problems

Problem 1 — Wavelength emitted by GaAs LED

Find λ\lambda for GaAs (Eg=1.43 eVE_g = 1.43\ \text{eV}).

λ=hcEg=1240 eV⋅nm1.43 eV=867 nm\lambda = \dfrac{hc}{E_g} = \dfrac{1240\ \text{eV·nm}}{1.43\ \text{eV}} = 867\ \text{nm} (IR).

Problem 2 — Minority carrier density in n-type Si

Si at 300 K, ND=1017 cm3N_D = 10^{17}\ \text{cm}^{-3}. Find pp.

ni=1.5×1010n_i = 1.5\times 10^{10}. p=ni2/ND=2.25×1020/1017=2.25×103 cm3p = n_i^2/N_D = 2.25\times 10^{20}/10^{17} = 2.25\times 10^{3}\ \text{cm}^{-3}.

Problem 3 — Diode in series with a resistor

A Si diode (Vγ=0.7 VV_\gamma = 0.7\ \text{V}) is in series with a 1 kΩ\Omega resistor and a 5 V battery. Find the current.

Forward bias: VR=VVγ=50.7=4.3 VV_R = V - V_\gamma = 5 - 0.7 = 4.3\ \text{V}, so I=4.3 mAI = 4.3\ \text{mA}.

Problem 4 — Zener regulator

A 9.1 V Zener is connected through a 200 Ω200\ \Omega series resistor to a 12 V12\ \text{V} input, with a 1 kΩ1\ \text{k}\Omega load. Find the load current and Zener current.

Output across load = 9.1 V9.1\ \text{V}. Load current: IL=9.1/1000=9.1 mAI_L = 9.1/1000 = 9.1\ \text{mA}.

Input current: Iin=(129.1)/200=14.5 mAI_{in} = (12 - 9.1)/200 = 14.5\ \text{mA}.

Zener current: IZ=14.59.1=5.4 mAI_Z = 14.5 - 9.1 = 5.4\ \text{mA}.

Problem 5 — Half-wave vs full-wave ripple

If Vm=10 VV_m = 10\ \text{V}, find VDCV_{DC} for HWR and FWR.

HWR: VDC=Vm/π=10/3.14=3.18 VV_{DC} = V_m/\pi = 10/3.14 = 3.18\ \text{V}.

FWR: VDC=2Vm/π=6.37 VV_{DC} = 2V_m/\pi = 6.37\ \text{V}.

Problem 6 — Transistor in CE configuration

A npn transistor has β=200\beta = 200, VCC=10 VV_{CC} = 10\ \text{V}, RC=2 kΩR_C = 2\ \text{k}\Omega. For IB=25 μAI_B = 25\ \mu\text{A}, find ICI_C, VCEV_{CE}, and check if transistor is in active region.

IC=20025 μA=5 mAI_C = 200\cdot 25\ \mu\text{A} = 5\ \text{mA}. VRC=52=10 VV_{R_C} = 5\cdot 2 = 10\ \text{V}. VCE=VCCVRC=1010=0 VV_{CE} = V_{CC} - V_{R_C} = 10 - 10 = 0\ \text{V}.

Transistor is saturated: it cannot deliver 5 mA5\ \text{mA} with VCE0V_{CE}\approx 0. Actual ICVCC/RC=5 mAI_C\approx V_{CC}/R_C = 5\ \text{mA} at VCE,sat0.2 VV_{CE,\text{sat}}\approx 0.2\ \text{V}.

Problem 7 — Build XOR from NAND

Show XOR can be built using four NAND gates.

Let A,BA, B be inputs. Define:

  • C=ABC = \overline{A\cdot B} (NAND 1)
  • D=AC=A+Cˉ(...)D = \overline{A\cdot C} = A + \bar C\cdot \text{(...)} — easier: let P=AABP = \overline{A\cdot \overline{A\cdot B}}, Q=BABQ = \overline{B\cdot \overline{A\cdot B}}, Y=PQY = \overline{P\cdot Q}.

Then Y=ABY = A\oplus B. Four NANDs total. ✓

JEE/NEET Edge Cases

  1. Mass-action law np=ni2np = n_i^2 holds in thermal equilibrium — not under bias or illumination.
  2. Hall effect distinguishes n- vs p-type: same direction of current II in opposite-sign material gives opposite Hall voltage.
  3. Avalanche vs. Zener mechanism: dopant density and breakdown voltage indicate which. VZ<5V_Z< 5 V = Zener; VZ>6V_Z>6 V = avalanche; 5<VZ<65<V_Z< 6 is mixed.
  4. Direct vs. indirect gap: Si and Ge are indirect (no LED emission); GaAs, GaN are direct (LED, laser).
  5. Diode ideality: assume "ideal" unless told otherwise — drop VγV_\gamma in forward, I=0I=0 in reverse.
  6. Peak inverse voltage (PIV):
    • HWR: PIV =Vm= V_m.
    • FWR centre-tap: PIV =2Vm= 2 V_m.
    • FWR bridge: PIV =Vm= V_m.
  7. Ripple factor:
    • HWR: r=1.21r = 1.21.
    • FWR: r=0.482r = 0.482.
  8. Transistor α\alpha vs β\beta: α=β/(1+β)\alpha = \beta/(1+\beta). If β=99\beta = 99, α=0.99\alpha = 0.99.
  9. CE output is 180° phase-shifted from input; CB and CC are in phase.
  10. NAND and NOR are universal — both can implement NOT, AND, OR independently.
  11. Photon energy for LED/solar: λ(nm)=1240/Eg(eV)\lambda(\text{nm}) = 1240/E_g(\text{eV}).
  12. Static vs dynamic resistance:
    • Static R=V/IR = V/I.
    • Dynamic r=dV/dIr = dV/dI.

Quick Recap

  • Bands: conductor (Eg=0E_g = 0), insulator (Eg>3E_g > 3 eV), semiconductor (Eg1E_g \sim 1 eV).
  • Intrinsic: n=p=nin = p = n_i. Extrinsic: n-type (donor, group V), p-type (acceptor, group III).
  • Mass action: np=ni2np = n_i^2.
  • p-n junction: depletion region, Vb0.7 VV_b\approx 0.7\ \text{V} (Si), 0.3 V0.3\ \text{V} (Ge).
  • Diode: Shockley I=I0(eeV/kT1)I = I_0(e^{eV/kT}-1); forward VγV_\gamma knee; reverse small I0I_0; breakdown VZV_Z.
  • Rectifiers: HWR (VDC=Vm/πV_{DC} = V_m/\pi, ripple ff), FWR (VDC=2Vm/πV_{DC} = 2V_m/\pi, ripple 2f2f).
  • Zener: reverse-breakdown regulator.
  • LED: forward, direct-gap, λ=hc/Eg\lambda = hc/E_g. Photodiode: reverse. Solar cell: open.
  • Transistor: IE=IB+ICI_E = I_B + I_C, β=IC/IB\beta = I_C/I_B. CE amplifier, CE switch.
  • Gates: NOT, AND, OR, NAND (universal), NOR (universal), XOR.

Formula Sheet

QuantityFormulaComments
Intrinsic carrier densityniT3/2eEg/2kTn_i\propto T^{3/2}e^{-E_g/2kT}Si @ 300 K: 1.5×10101.5\times 10^{10} cm3^{-3}
Mass-action lawnp=ni2np = n_i^2Equilibrium only
Conductivityσ=e(nμn+pμp)\sigma = e(n\mu_n + p\mu_p)μn>μp\mu_n > \mu_p
Built-in potentialVb=(kT/e)ln(NAND/ni2)V_b = (kT/e)\ln(N_A N_D/n_i^2)0.7\sim 0.7 V Si
Shockley diodeI=I0(eeV/ηkT1)I = I_0(e^{eV/\eta kT} - 1)η=1\eta = 122
Thermal voltageVT=kT/e26 mVV_T = kT/e \approx 26\ \text{mV} at 300 K
HWR VDCV_{DC}Vm/πV_m/\piRipple 1.211.21
HWR VrmsV_{rms}Vm/2V_m/2
FWR VDCV_{DC}2Vm/π2V_m/\piRipple 0.4820.482
FWR VrmsV_{rms}Vm/2V_m/\sqrt 2
Rectifier efficiencyηHWR=40.6%\eta_{HWR}=40.6\%, ηFWR=81.2%\eta_{FWR}=81.2\%
PIVHWR VmV_m, centre-tap 2Vm2V_m, bridge VmV_m
Filter ripple voltageΔVVm/(2fRLC)\Delta V\approx V_m/(2fR_LC)FWR with cap
LED wavelengthλ=hc/Eg=1240/Eg(eV)\lambda = hc/E_g = 1240/E_g(\text{eV}) nm
Transistor currentsIE=IB+ICI_E = I_B + I_C
α,β\alpha, \beta relationβ=α/(1α)\beta = \alpha/(1-\alpha), α=β/(1+β)\alpha = \beta/(1+\beta)
CE voltage gainAV=βRC/rinA_V = -\beta R_C/r_{in}180°180° phase shift
NAND universalityNOT =AA= \overline{A\cdot A}
Boltzmann thermal voltagekT/e=25.85 mVkT/e = 25.85\ \text{mV} @ 300 K

Sub-topics

8 pages
Quiz
Chapter 14: Semiconductor Electronics — Quiz
15 questions · pick the best answer
Q1

At absolute zero, which statement about a pure semiconductor is correct?

Q2

Doping silicon with phosphorus (group V) produces:

Q3

The mass-action law for a semiconductor in thermal equilibrium states:

Q4

In a p-n junction at equilibrium with no external voltage:

Q5

The cut-in (knee) voltage for a silicon diode is approximately:

Q6

The DC output voltage of a full-wave rectifier with peak input Vm is:

Q7

The ripple frequency of a full-wave rectifier fed from a 50 Hz AC mains is:

Q8

A Zener diode in a voltage regulator circuit is operated in:

Q9

Which device is operated in forward bias to emit light?

Q10

A solar cell operates:

Q11

In an npn transistor with β = 100, if the base current is 30 μA, the collector current is approximately:

Q12

In a common-emitter amplifier, the phase relationship between input and output voltage is:

Q13

Which of the following is a universal gate?

Q14

The truth table A B → Y given by (0,0)→0, (0,1)→1, (1,0)→1, (1,1)→0 describes a:

Q15

An LED emits red light at λ ≈ 650 nm. The band gap of the material is approximately: